High-Throughput Optical Inspection
High-speed 3D microscopic inspection with highly-parallelizable, post-detection, refocusing for defect detection and classification.
Job: Defect Detection and Classification
- Advanced manufacturing produces parts with critical to quality (CTQ) specifications that require microscopy-based quality control.
- QC can be very expensive at large manufacturing volumes
- Non-destructive testing often involves large-area microscopic surveys
- Inspection at higher resolutions requires moving the sample or the imaging systems through a optically large 3D volume (many image frames).
Challenge: High Sensitivity, Speed & Resolution Microscopy
- The scanning speed is limited by the imaging system and/or sample weights
- Scanning through multiple Z planes is required if features are 3D distributed
- Building libraries of defect features and/or process characterizations require very expensive/time-consuming scans and slow-down R&D
- Data has limited quantitative features and may not be reproducible
- Difficult to adapt imaging system to different resolutions
Computational Quantitative Phase, Amplitude, and Polarization Microscope
Fast automated system for acquiring complete, quantitative representations of the phase, amplitude and polarization structure of transparent or reflective objects. Catalog of digitally normalized full-field representations of defect or part features.
Value Proposition
Coherent computational microscope for high-speed “full-field digitization” of transparent or reflective parts. High-resolution quantitative phase, amplitude and polarization representations of defect and part features. Reliable quantitative data normalization across different systems (e.g. production lines, sites, etc.). Continuous build-up of the feature catalog independent of the data acquisition site/system. The rich, full-field, data enables more powerful machine learning and automated detection and classification.
Let’s Work Together
Microscopy technology has not evolved in its general practice for a century: it is still a labor intensive, difficult to scale, process.
Our technology is uniquely capable of fully-digital, high-accuracy, quantitative microscopy of stained and unstained samples.
Through synergistic collaboration, we can solve important health screening and diagnostic challenges, benefiting humanity.
Contact Us
We’re eager to learn about your requirements and happy to tell you more about our technology.
Ithaca, NY 14850
+1 917 436 1624
info@cdei.net